(EMAILWIRE.COM, November 09, 2007 ) MADISON, Wisc. − During the 2007 Materials Research Society Fall
Meeting to take place at the Hynes Convention Center in Boston November 26-30, Bruker AXS, a leading global provider of advanced X-ray solutions for life and advanced materials sciences, will announce the recipient of its 2007 Excellence in X-ray Diffraction (XRD) scholarship -- based on unique experiments performed by university students. Recognizing academic achievement in X-ray Diffraction, Bruker AXS will present a $6,000 scholarship for the most unique application in the field of materials research. The winner has been selected by an independent panel of judges: Dr. Tom Blanton from Eastman Kodak; Dr. Jim Kaduk from Innovene and current Board Chairman of the International Centre for Diffraction Data; Dr. Pam Whitfield from National Research Council Canada; Dr. Jim Britten from McMaster University; and Dr. Nattamai Bhuvanesh, Department of Chemistry at Texas A&M University.

The award ceremony will take place at the Bruker AXS booth, # 300, at 5:00 PM Eastern Time on Tuesday, November 27th.

“We are very pleased again this year to provide this scholarship to such an extraordinary student,” says Uwe Preckwinkel, Bruker AXS XRD Sales and Marketing Manager. “Both Bruker AXS and the judges are most impressed by the quality of the XRD experiments these students have performed, and the valuable scientific results they have obtained,” adds Dr. Frank Burgaezy, Executive Vice President of Bruker AXS in charge of the company’s global XRD and XRF business.

The MRS Fall Exhibit will provide a unique opportunity to present innovative products
and services to over 5,000 attendees from all sectors of the global materials science and engineering communities. For more information, please visit www.mrs.org.

About XRD
X-Ray Scattering is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics and semiconductors. Throughout industry and research institutions, XRS & XRD have become an indispensable method for materials investigation, characterization and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations, controlled sample environment, micro-diffraction, nanomaterials, lab- and process automation, and high-throughput polymorph screening.

Bruker AXS scientists are available at the Company’s MRS Fall Conference booth to discuss these awards and the corresponding research findings. Bruker AXS has published the above papers on CD available to the press, MRS attendees, and other scientists.

Contact:

Uwe Preckwinkel
Bruker AXS
uwe.preckwinkel@bruker-axs.com
Tel: 608-276-3047
www.bruker-axs.com

Contact Information:
Bruker
Uwe Preckwinkel
Tel:
Email us


This is a press release. Press release distribution and press release services by EmailWire.Com: http://www.emailwire.com/us-press-release-distribution.php.